Symposium H
This Symposium focuses on recent advances in the structural, microstructural, and mechanical characterization of coatings and thin films, which enhance our understanding of the growth and surface modification processes as well as the fundamental structure-property-processing relationships. Of interest are contributions that either highlight the application of, or draw attention to, recent advances in analytical methods, characterization techniques, and novel nano-mechanical testing methods for coating evaluation. Analytical methods may include numerical evaluation and quantification procedures (e.g., factor analysis, depth profiling, 3D mapping, etc.) to reveal the micro- and nano-structure, chemical composition, residual stress, chemical states, and phases of coatings, thin films, interfaces, and surfaces during or after surface modification. Micro- and nanomechanical methods may include compression, bending, or toughness testing to determine coating behavior, particularly at elevated/service temperatures and in harsh environments, and the relationship to coating performance and lifetime. Residual stress analysis, phase characterization, surface topography probes, compositional analysis, high-resolution spatial imaging and analysis, and hardness measurements continue to be subjects of interest in the sessions. In-situ characterization methods and other novel techniques presenting the combination between microstructural nano-mechanical probes are highly encouraged.
H1: Spatially-resolved and In-Situ Characterization of Thin Films and Engineered Surfaces:
In this session all aspects concerning novel spatially-resolved structural, microstructural and chemical characterization techniques, especially those that advance the in-depth understanding of the relationship between the processing, the structure and the properties of thin films and engineered surfaces. Particular attention will be given to papers providing information on novel cutting-edge experiments on the analysis of the microstructure and microstructural evolution of thin films, including in-situ measurements during film growth, spatially resolved analysis of residual stress and three-dimensional chemical mapping. Emphasis will be given to novel high-resolution techniques, such as Atom Probe Tomography, X-ray nano-diffraction, advanced TEM characterization, micro-Raman spectroscopy, etc. Papers are furthermore also solicited in the emerging area of three-dimensional microstructural characterization in small volumes, such as FIB/SEM tomography, in-situ EBSD and/or ToF-SIMS 3D mapping.
H1. Invited Speakers:
- Yolita Eggeler, Karlsruhe Institute of Technology (KIT), Germany, “In situ TEM Microscopy for Revealing Small Scale Materials Mechanisms”
- Andrew Minor, University of California, Berkeley, USA, “In Situ Observations and Measurements of Plastic Deformation, Phase Transformations and Fracture With 4D-STEM”
H2: Advanced Mechanical Testing of Surfaces, Thin Films, Coatings and Small Volumes:
This session covers advanced mechanical characterization techniques for surfaces, thin films and coatings with a focus on the development of novel methods rather than the application of standard methods to new materials. This includes novel methods of performing nanoindentation testing or analysis methods and testing of micro-scale testing geometries produced using focused ion beam (FIB) machining or issues related to the FIB-machined structures. Particular attention will be given to papers providing details on developing techniques such as novel fracture testing geometries. Emphasis will be given to testing techniques performed in situ in the SEM, TEM, Raman, X-ray beamline, etc. Papers are also solicited in the emerging area of nano- or micro-testing at high strain rates.
H2. Invited Speakers:
- Jens Bauer, University of California, Irvine, USA, “Tensegrity Metamaterials – Towards Failure Resistant Engineering Systems”
- Ralph Spolenak, ETH Zürich, Switzerland, “Optical Analysis by Local and Global Reflectance Anisotropy Spectroscopy: Nanomechanics, Topography and Crystal Orientation”
H3: Characterization of Coatings and Small Volumes in Harsh Environments:
This session covers the characterization of the coatings microstructure and mechanical behavior under harsh and/or unusual conditions, such as high or cryogenic temperatures, radiation, hydrogen embrittlement and high strain rates. Particular attention will be given to papers providing characterization in-situ in the harsh environment, rather than ex-situ after exposure: e.g. nanoindentation testing performed at high temperatures rather than after an annealing treatment in a separate furnace. Emphasis will be given to work that shows progress pushing the testing envelope further into harsher environments or combining multiple characterization techniques to gain information on coatings’ behavior under severe or aggressive environments.
H3. Invited Speakers:
- Brad Boyce, Sandia National Laboratories, USA, “In-situ Characterization of Nanocrystalline Pt-Au Thin Films in Thermal, Mechanical, and Irradiation Environments”